AFM/SPM (Scanning Probe Microscope)

Bruker-MMSPM Nanoscope 8


 Scanning Probe Microscopy covers several related technologies for imaging and measuring surfaces on a fine scale, down to the level of molecules and groups of atoms.

It performs the full range of Atomic Force Microscopy (AFM) and Scanning Tunnelling Microscopy (STM) techniques to measure surface characteristics like topography, elasticity, friction, nanohardness, adhession and magnetic/electrical fields.